TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_13_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-016-022-01 | FUSED_ID : 6359364768384483681
  IC_TEMP :  -71.26 | VDDM : 1205.17 | AUX_INT : -950.86 | CsaBias : -688.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.14382e-02 / 2
  ADC_P0  : -9.50862e-01 ± 3.74419e-01
  ADC_P1  : 2.25588e-02 ± 7.09710e-03
  ADC_P2  : -5.48373e-05 ± 2.78419e-05
  CSA_Chi2/NDF : 1.51125e-04 / 2
  CSA_P0  : 6.01150e-02 ± 8.19956e-03
  CSA_P1  : 9.81765e-03 ± 6.17778e-04
  CSA_P2  : -4.71179e-05 ± 9.40803e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [14, 22, 43, 57, 76, 92, 98, 108, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [15, 33, 40, 43, 46, 50, 55, 66, 69, 70, 76, 79, 81, 91, 97, 114, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3585', '1.800', '0.1279', '1.799', '0.0916', '7.000', '0.7081', 1, 1, 1, 1, 1724343212.4914691]
VI_after__Init : ['1.202', '0.3586', '1.800', '0.1277', '1.800', '0.0844', '7.000', '0.7074', 1, 1, 1, 1, 1724343220.5947142]
VI_at__the_End : ['1.202', '0.4885', '1.800', '0.1362', '1.803', '0.1126', '7.000', '0.7083', 1, 1, 1, 1, 1724343288.1957548]