TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_39_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-008-11 | FUSED_ID : 6359364768384487563
  IC_TEMP :  -54.94 | VDDM : 1120.15 | AUX_INT :   -8.18 | CsaBias :   67.02
  CONF_FAIL_REG : 1
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22966e-03 / 2
  ADC_P0  : -8.17705e-03 ± 2.37605e-02
  ADC_P1  : 8.40830e-03 ± 5.84444e-04
  ADC_P2  : -5.90756e-06 ± 2.85004e-06
  CSA_Chi2/NDF : 1.33722e-04 / 2
  CSA_P0  : 5.79854e-02 ± 7.71301e-03
  CSA_P1  : 9.71014e-03 ± 5.81119e-04
  CSA_P2  : -4.53383e-05 ± 8.84976e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [8, 44, 45, 59, 82, 85, 99, 101, 103, 119, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [4, 13, 19, 20, 22, 25, 31, 42, 63, 65, 73, 80, 83, 87, 93, 94, 112, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3763', '1.800', '0.1437', '1.799', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1724344744.5620155]
VI_after__Init : ['1.202', '0.3760', '1.800', '0.1437', '1.801', '0.0832', '7.000', '0.7076', 1, 1, 1, 1, 1724344752.7852974]
VI_at__the_End : ['1.202', '0.4861', '1.800', '0.1338', '1.799', '0.1105', '7.000', '0.7085', 1, 1, 1, 1, 1724344818.7492507]