TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_37_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-009-11 | FUSED_ID : 6359364768384487579
  IC_TEMP :  -61.66 | VDDM : 1119.38 | AUX_INT :   -7.85 | CsaBias :   65.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08582e-03 / 2
  ADC_P0  : -7.84818e-03 ± 2.22730e-02
  ADC_P1  : 8.25912e-03 ± 5.28878e-04
  ADC_P2  : -6.36562e-06 ± 2.47819e-06
  CSA_Chi2/NDF : 1.55720e-04 / 2
  CSA_P0  : 5.58986e-02 ± 8.32329e-03
  CSA_P1  : 9.50890e-03 ± 6.27100e-04
  CSA_P2  : -4.34540e-05 ± 9.54999e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [4, 5, 19, 35, 51, 68, 73, 95, 109, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [1, 22, 23, 25, 28, 33, 34, 38, 40, 44, 57, 67, 69, 70, 74, 75, 77, 99, 105, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1163', '1.800', '0.1145', '1.800', '0.0816', '7.000', '0.7076', 1, 1, 1, 1, 1724344648.8654995]
VI_after__Init : ['1.202', '0.1164', '1.800', '0.1145', '1.800', '0.0761', '7.000', '0.7076', 1, 1, 1, 1, 1724344656.8777509]
VI_at__the_End : ['1.202', '0.4760', '1.800', '0.1354', '1.808', '0.1141', '7.000', '0.7083', 1, 1, 1, 1, 1724344717.5241077]