TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_31_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-013-11 | FUSED_ID : 6359364768384487643
  IC_TEMP :  -54.67 | VDDM : 1117.01 | AUX_INT :   -9.28 | CsaBias :   70.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41203e-03 / 2
  ADC_P0  : -9.27781e-03 ± 2.54875e-02
  ADC_P1  : 7.97971e-03 ± 5.99017e-04
  ADC_P2  : -4.87111e-06 ± 2.80848e-06
  CSA_Chi2/NDF : 1.64653e-04 / 2
  CSA_P0  : 5.87724e-02 ± 8.55869e-03
  CSA_P1  : 1.00740e-02 ± 6.44835e-04
  CSA_P2  : -5.03415e-05 ± 9.82008e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [4, 12, 14, 18, 20, 28, 30, 45, 46, 58, 63, 69, 78, 86, 89, 90, 108, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [2, 6, 7, 11, 16, 30, 35, 44, 55, 61, 82, 83, 86, 101, 108, 114, 120, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3225', '1.800', '0.1295', '1.799', '0.0934', '7.000', '0.7084', 1, 1, 1, 1, 1724344266.3175793]
VI_after__Init : ['1.202', '0.3226', '1.800', '0.1296', '1.802', '0.0852', '7.000', '0.7070', 1, 1, 1, 1, 1724344274.4949582]
VI_at__the_End : ['1.201', '0.4891', '1.800', '0.1373', '1.803', '0.1098', '7.000', '0.7081', 1, 1, 1, 1, 1724344343.198419]