TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_29_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-014-11 | FUSED_ID : 6359364768384487659
  IC_TEMP :  -51.58 | VDDM : 1125.73 | AUX_INT :   -8.08 | CsaBias :   65.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17911e-03 / 2
  ADC_P0  : -8.07604e-03 ± 2.32833e-02
  ADC_P1  : 8.19480e-03 ± 5.65933e-04
  ADC_P2  : -5.12639e-06 ± 2.73263e-06
  CSA_Chi2/NDF : 1.22027e-04 / 2
  CSA_P0  : 5.92572e-02 ± 7.36802e-03
  CSA_P1  : 9.89866e-03 ± 5.55127e-04
  CSA_P2  : -4.58987e-05 ± 8.45393e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [8, 14, 36, 43, 60, 66, 80, 81, 84, 94, 113, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [0, 5, 23, 47, 48, 52, 62, 66, 67, 78, 83, 92, 93, 96, 107, 111, 116, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2593', '1.800', '0.1518', '1.800', '0.0885', '7.000', '0.7070', 1, 1, 1, 1, 1724344171.0231216]
VI_after__Init : ['1.201', '0.2593', '1.800', '0.1518', '1.801', '0.0828', '7.000', '0.7070', 1, 1, 1, 1, 1724344179.2094877]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1359', '1.806', '0.1107', '7.000', '0.7081', 1, 1, 1, 1, 1724344245.9301362]