TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_27_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-015-11 | FUSED_ID : 6359364768384487675
  IC_TEMP :  -56.41 | VDDM : 1130.12 | AUX_INT :   -8.02 | CsaBias :   84.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37665e-03 / 2
  ADC_P0  : -8.01769e-03 ± 2.52453e-02
  ADC_P1  : 7.74093e-03 ± 5.95863e-04
  ADC_P2  : -3.66543e-06 ± 2.80197e-06
  CSA_Chi2/NDF : 2.23239e-04 / 2
  CSA_P0  : 5.64724e-02 ± 9.96569e-03
  CSA_P1  : 1.03331e-02 ± 7.50843e-04
  CSA_P2  : -5.39152e-05 ± 1.14344e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [15, 29, 31, 44, 48, 57, 79, 91, 99, 100, 115, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [1, 24, 30, 52, 55, 64, 68, 85, 107, 110, 111, 115, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0903', '1.800', '0.1566', '1.799', '0.0838', '7.000', '0.7072', 1, 1, 1, 1, 1724344075.1546786]
VI_after__Init : ['1.201', '0.0903', '1.800', '0.1565', '1.801', '0.0782', '7.000', '0.7070', 1, 1, 1, 1, 1724344083.2291024]
VI_at__the_End : ['1.201', '0.4943', '1.800', '0.1358', '1.801', '0.1109', '7.000', '0.7078', 1, 1, 1, 1, 1724344151.0137584]