TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_26_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-016-12 | FUSED_ID : 6359364768384487692
  IC_TEMP :  -51.86 | VDDM : 1120.77 | AUX_INT :   -8.24 | CsaBias :   70.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12887e-03 / 2
  ADC_P0  : -8.24293e-03 ± 2.27662e-02
  ADC_P1  : 7.93219e-03 ± 5.31665e-04
  ADC_P2  : -4.97807e-06 ± 2.46837e-06
  CSA_Chi2/NDF : 1.28624e-04 / 2
  CSA_P0  : 6.00274e-02 ± 7.56457e-03
  CSA_P1  : 9.90923e-03 ± 5.69936e-04
  CSA_P2  : -4.68164e-05 ± 8.67944e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [14, 21, 23, 40, 43, 54, 57, 63, 67, 70, 80, 83, 102, 106, 107, 113, 119, 124, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [8, 27, 32, 39, 40, 41, 76, 89, 94, 95, 98, 103, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2036', '1.800', '0.1735', '1.800', '0.0867', '7.000', '0.7080', 1, 1, 1, 1, 1724343978.650415]
VI_after__Init : ['1.202', '0.2036', '1.800', '0.1735', '1.800', '0.0801', '7.000', '0.7071', 1, 1, 1, 1, 1724343986.763811]
VI_at__the_End : ['1.201', '0.4945', '1.800', '0.1343', '1.804', '0.1110', '7.000', '0.7079', 1, 1, 1, 1, 1724344053.7394483]