TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_24_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-017-12 | FUSED_ID : 6359364768384487708
  IC_TEMP :  -55.42 | VDDM : 1124.89 | AUX_INT :   -6.61 | CsaBias :   80.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.74507e-04 / 2
  ADC_P0  : -6.61337e-03 ± 2.00385e-02
  ADC_P1  : 7.96312e-03 ± 4.76741e-04
  ADC_P2  : -4.81600e-06 ± 2.24456e-06
  CSA_Chi2/NDF : 1.15279e-04 / 2
  CSA_P0  : 5.96726e-02 ± 7.16140e-03
  CSA_P1  : 9.63338e-03 ± 5.39560e-04
  CSA_P2  : -4.31843e-05 ± 8.21686e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [1, 6, 10, 12, 36, 57, 58, 74, 83, 88, 103, 107, 112, 116, 126]
 | N_BROKEN_SLOW :  [29]
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [1, 4, 14, 23, 36, 38, 41, 43, 47, 57, 75, 76, 77, 87, 96, 107]
 | P_BROKEN_SLOW :  [29]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3054', '1.800', '0.1325', '1.799', '0.0865', '7.000', '0.7073', 1, 1, 1, 1, 1724343882.7821817]
VI_after__Init : ['1.202', '0.3053', '1.800', '0.1325', '1.800', '0.0808', '7.000', '0.7069', 1, 1, 1, 1, 1724343891.4954946]
VI_at__the_End : ['1.202', '0.4914', '1.800', '0.1349', '1.802', '0.1101', '7.000', '0.7079', 1, 1, 1, 1, 1724343959.2990727]