TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_21_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-019-12 | FUSED_ID : 6359364768384487740
  IC_TEMP :  -55.83 | VDDM : 1128.32 | AUX_INT :   -7.72 | CsaBias :   64.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85276e-04 / 2
  ADC_P0  : -7.72024e-03 ± 2.12388e-02
  ADC_P1  : 8.05166e-03 ± 5.00050e-04
  ADC_P2  : -5.45292e-06 ± 2.33334e-06
  CSA_Chi2/NDF : 1.00651e-04 / 2
  CSA_P0  : 5.91220e-02 ± 6.69163e-03
  CSA_P1  : 9.24800e-03 ± 5.04166e-04
  CSA_P2  : -3.76992e-05 ± 7.67785e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [13, 26, 35, 47, 68, 82, 87, 88, 94, 105, 109, 118]
 | N_BROKEN_SLOW :  [75]
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [25, 34, 39, 54, 63, 69, 106, 111, 116, 119, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1226', '1.800', '0.1477', '1.800', '0.0850', '7.000', '0.7075', 1, 1, 1, 1, 1724343691.5047624]
VI_after__Init : ['1.202', '0.1227', '1.800', '0.1477', '1.799', '0.0793', '7.000', '0.7072', 1, 1, 1, 1, 1724343699.779011]
VI_at__the_End : ['1.202', '0.4882', '1.800', '0.1354', '1.799', '0.1107', '7.000', '0.7080', 1, 1, 1, 1, 1724343766.4265857]