TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_19_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-020-12 | FUSED_ID : 6359364768384487756
  IC_TEMP :  -55.01 | VDDM : 1124.01 | AUX_INT :   -9.18 | CsaBias :   78.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36987e-03 / 2
  ADC_P0  : -9.17808e-03 ± 2.51041e-02
  ADC_P1  : 7.99030e-03 ± 5.90006e-04
  ADC_P2  : -4.92066e-06 ± 2.76624e-06
  CSA_Chi2/NDF : 1.63275e-04 / 2
  CSA_P0  : 5.88901e-02 ± 8.52280e-03
  CSA_P1  : 1.00802e-02 ± 6.42132e-04
  CSA_P2  : -4.89878e-05 ± 9.77891e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [32, 37, 39, 40, 47, 67, 71, 77, 87, 92, 97, 101, 115, 120, 121, 124, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [15, 18, 37, 42, 60, 68, 73, 83, 96, 100, 112, 118, 120, 121, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3175', '1.800', '0.1366', '1.799', '0.0880', '7.000', '0.7074', 1, 1, 1, 1, 1724343595.6505244]
VI_after__Init : ['1.202', '0.3176', '1.800', '0.1365', '1.801', '0.0826', '7.000', '0.7072', 1, 1, 1, 1, 1724343603.7719939]
VI_at__the_End : ['1.202', '0.4983', '1.800', '0.1379', '1.801', '0.1105', '7.000', '0.7082', 1, 1, 1, 1, 1724343664.5669363]