TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_42_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-018-009-05 | FUSED_ID : 6359364768384491669
  IC_TEMP :  -63.67 | VDDM : 1128.17 | AUX_INT : -119.78 | CsaBias :  -19.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44653e-03 / 2
  ADC_P0  : -1.19777e-01 ± 3.18266e-02
  ADC_P1  : 1.01606e-02 ± 7.59363e-04
  ADC_P2  : -1.16789e-05 ± 3.57131e-06
  CSA_Chi2/NDF : 1.85136e-04 / 2
  CSA_P0  : 5.94547e-02 ± 9.07543e-03
  CSA_P1  : 1.05642e-02 ± 6.83768e-04
  CSA_P2  : -5.74445e-05 ± 1.04130e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [12, 13, 17, 24, 33, 58, 65, 90, 96, 99, 104, 106, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [9, 22, 25, 33, 37, 47, 49, 50, 90, 96, 106, 111, 120, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1878', '1.800', '0.1321', '1.800', '0.0835', '7.000', '0.7078', 1, 1, 1, 1, 1724344935.962571]
VI_after__Init : ['1.202', '0.1879', '1.800', '0.1321', '1.800', '0.0776', '7.000', '0.7076', 1, 1, 1, 1, 1724344944.213135]
VI_at__the_End : ['1.202', '0.4908', '1.800', '0.1368', '1.804', '0.1156', '7.000', '0.7085', 1, 1, 1, 1, 1724345004.8131435]