TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_43_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-018-010-05 | FUSED_ID : 6359364768384491685
  IC_TEMP :  -58.75 | VDDM : 1126.54 | AUX_INT :   -7.23 | CsaBias :   69.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26789e-03 / 2
  ADC_P0  : -7.23235e-03 ± 2.41357e-02
  ADC_P1  : 8.54859e-03 ± 6.06186e-04
  ADC_P2  : -5.99998e-06 ± 3.01703e-06
  CSA_Chi2/NDF : 1.46127e-04 / 2
  CSA_P0  : 6.16869e-02 ± 8.06282e-03
  CSA_P1  : 9.78137e-03 ± 6.07476e-04
  CSA_P2  : -4.61237e-05 ± 9.25113e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [11, 18, 22, 30, 41, 45, 50, 53, 64, 69, 73, 82, 85, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [2, 14, 16, 17, 30, 52, 55, 61, 68, 76, 85, 105, 107, 121, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2491', '1.800', '0.1430', '1.800', '0.0876', '7.000', '0.7079', 1, 1, 1, 1, 1724345032.0552485]
VI_after__Init : ['1.202', '0.2491', '1.800', '0.1430', '1.800', '0.0817', '7.000', '0.7076', 1, 1, 1, 1, 1724345040.2527041]
VI_at__the_End : ['1.202', '0.4925', '1.800', '0.1405', '1.804', '0.1135', '7.000', '0.7086', 1, 1, 1, 1, 1724345101.2565775]