TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_45_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-018-011-05 | FUSED_ID : 6359364768384491701
  IC_TEMP :  -58.13 | VDDM : 1210.71 | AUX_INT : -1169.43 | CsaBias : -823.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.27070e-02 / 2
  ADC_P0  : -1.16943e+00 ± 5.74722e-01
  ADC_P1  : 2.56047e-02 ± 1.05711e-02
  ADC_P2  : -6.46351e-05 ± 4.09559e-05
  CSA_Chi2/NDF : 1.57182e-04 / 2
  CSA_P0  : 5.90927e-02 ± 8.36227e-03
  CSA_P1  : 9.85137e-03 ± 6.30036e-04
  CSA_P2  : -4.80514e-05 ± 9.59471e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [16, 45, 51, 73, 74, 81, 82, 84, 93, 94, 105, 113, 115, 116, 120, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 5, 35, 89, 93, 94, 96, 117, 123, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4308', '1.800', '0.1383', '1.799', '0.1024', '7.000', '0.7082', 1, 1, 1, 1, 1724345128.3406327]
VI_after__Init : ['1.202', '0.4309', '1.800', '0.1384', '1.802', '0.0968', '7.000', '0.7075', 1, 1, 1, 1, 1724345136.5171509]
VI_at__the_End : ['1.198', '0.4853', '1.800', '0.1359', '1.800', '0.1131', '7.000', '0.7089', 1, 1, 1, 1, 1724345204.0784452]