TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_47_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-018-012-05 | FUSED_ID : 6359364768384491717
  IC_TEMP :  -56.56 | VDDM : 1124.45 | AUX_INT :   -7.78 | CsaBias :   58.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01945e-03 / 2
  ADC_P0  : -7.77925e-03 ± 2.16248e-02
  ADC_P1  : 8.31409e-03 ± 5.31832e-04
  ADC_P2  : -5.40327e-06 ± 2.59598e-06
  CSA_Chi2/NDF : 1.47457e-04 / 2
  CSA_P0  : 5.96423e-02 ± 8.09943e-03
  CSA_P1  : 1.01275e-02 ± 6.10234e-04
  CSA_P2  : -5.03876e-05 ± 9.29314e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [10, 19, 20, 21, 37, 57, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [10, 11, 45, 48, 59, 68, 82, 88, 93, 104, 111, 117, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3158', '1.800', '0.1357', '1.800', '0.0943', '7.000', '0.7088', 1, 1, 1, 1, 1724345224.2199872]
VI_after__Init : ['1.202', '0.3159', '1.800', '0.1357', '1.801', '0.0870', '7.000', '0.7078', 1, 1, 1, 1, 1724345232.2314703]
VI_at__the_End : ['1.202', '0.4915', '1.800', '0.1378', '1.805', '0.1144', '7.000', '0.7088', 1, 1, 1, 1, 1724345289.528451]