TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_51_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-018-015-05 | FUSED_ID : 6359364768384491765
  IC_TEMP :  -58.03 | VDDM : 1124.70 | AUX_INT :   -8.58 | CsaBias :   72.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48861e-03 / 2
  ADC_P0  : -8.57920e-03 ± 2.61519e-02
  ADC_P1  : 8.17060e-03 ± 6.21732e-04
  ADC_P2  : -5.54287e-06 ± 2.94301e-06
  CSA_Chi2/NDF : 1.78876e-04 / 2
  CSA_P0  : 5.68119e-02 ± 8.92068e-03
  CSA_P1  : 1.03829e-02 ± 6.72109e-04
  CSA_P2  : -5.53073e-05 ± 1.02354e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [0, 1, 9, 15, 27, 35, 37, 40, 56, 64, 80, 89, 102, 110, 114, 117, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [5, 9, 10, 14, 17, 23, 27, 59, 65, 82, 95, 106, 107, 116, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3863', '1.800', '0.1394', '1.800', '0.0908', '7.000', '0.7080', 1, 1, 1, 1, 1724345511.502428]
VI_after__Init : ['1.202', '0.3865', '1.800', '0.1395', '1.801', '0.0853', '7.000', '0.7079', 1, 1, 1, 1, 1724345519.770852]
VI_at__the_End : ['1.202', '0.4857', '1.800', '0.1346', '1.807', '0.1120', '7.000', '0.7089', 1, 1, 1, 1, 1724345586.0300977]