TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_55_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-018-017-02 | FUSED_ID : 6359364768384491794
  IC_TEMP :  -55.16 | VDDM : 1126.51 | AUX_INT :   -8.32 | CsaBias :   79.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18157e-03 / 2
  ADC_P0  : -8.31918e-03 ± 2.32994e-02
  ADC_P1  : 8.06077e-03 ± 5.55000e-04
  ADC_P2  : -5.03998e-06 ± 2.62727e-06
  CSA_Chi2/NDF : 1.27007e-04 / 2
  CSA_P0  : 5.71624e-02 ± 7.51684e-03
  CSA_P1  : 9.85323e-03 ± 5.66340e-04
  CSA_P2  : -4.65213e-05 ± 8.62469e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [21, 30, 37, 49, 56, 58, 71, 95, 98, 103, 110, 112, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [8, 20, 25, 31, 35, 42, 52, 60, 67, 75, 106, 107, 109, 115, 116, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0995', '1.800', '0.1470', '1.799', '0.0826', '7.000', '0.7090', 1, 1, 1, 1, 1724345702.5464194]
VI_after__Init : ['1.202', '0.0995', '1.800', '0.1469', '1.800', '0.0751', '7.000', '0.7078', 1, 1, 1, 1, 1724345710.8187723]
VI_at__the_End : ['1.200', '0.4894', '1.800', '0.1338', '1.807', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1724345771.4323795]