TEST_NAME : Wafer
TEST_DATE : 24_08_26-14_35_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-018-020-08 | FUSED_ID : 6359364768385540424
  IC_TEMP :  -72.72 | VDDM : 1100.97 | AUX_INT :  -12.20 | CsaBias :   59.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.45498e-03 / 2
  ADC_P0  : -1.22021e-02 ± 3.36448e-02
  ADC_P1  : 9.04875e-03 ± 8.68715e-04
  ADC_P2  : -7.11821e-06 ± 4.48833e-06
  CSA_Chi2/NDF : 2.25646e-04 / 2
  CSA_P0  : 5.95482e-02 ± 1.00193e-02
  CSA_P1  : 1.02974e-02 ± 7.54879e-04
  CSA_P2  : -6.19526e-05 ± 1.14959e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [2, 33, 46, 56, 81, 84, 89, 91, 92, 96, 98, 118, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [19, 23, 25, 28, 38, 50, 55, 58, 60, 64, 67, 84, 93, 101, 105, 112, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2268', '1.799', '0.1572', '1.800', '0.0928', '7.000', '0.7081', 1, 1, 1, 1, 1724675712.835999]
VI_after__Init : ['1.201', '0.2269', '1.800', '0.1572', '1.800', '0.0852', '7.000', '0.7071', 1, 1, 1, 1, 1724675721.0863242]
VI_at__the_End : ['1.195', '0.4540', '1.803', '0.1362', '1.799', '0.1181', '7.000', '0.7079', 1, 1, 1, 1, 1724675785.74451]