TEST_NAME : Wafer
TEST_DATE : 24_08_26-14_36_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-018-020-08 | FUSED_ID : 6359364768385540424
  IC_TEMP :  -75.26 | VDDM : 1120.92 | AUX_INT :  -11.03 | CsaBias :   52.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86878e-03 / 2
  ADC_P0  : -1.10252e-02 ± 2.92966e-02
  ADC_P1  : 9.09813e-03 ± 7.63010e-04
  ADC_P2  : -7.23433e-06 ± 3.96826e-06
  CSA_Chi2/NDF : 2.01792e-04 / 2
  CSA_P0  : 5.98292e-02 ± 9.47488e-03
  CSA_P1  : 1.02132e-02 ± 7.13864e-04
  CSA_P2  : -6.01017e-05 ± 1.08713e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [9, 10, 11, 28, 69, 113, 117, 118, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [2, 7, 18, 35, 50, 58, 63, 64, 69, 72, 80, 89, 95, 114, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2264', '1.800', '0.1556', '1.800', '0.0910', '7.000', '0.7072', 1, 1, 1, 1, 1724675808.7348824]
VI_after__Init : ['1.202', '0.2265', '1.800', '0.1555', '1.801', '0.0850', '7.000', '0.7069', 1, 1, 1, 1, 1724675817.0821505]
VI_at__the_End : ['1.202', '0.4562', '1.800', '0.1359', '1.801', '0.1180', '7.000', '0.7081', 1, 1, 1, 1, 1724675874.3208249]