TEST_NAME : Wafer
TEST_DATE : 24_08_23-08_52_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-003-022-09 | FUSED_ID : 6359364768385479017
  IC_TEMP :  -97.57 | VDDM : 1114.13 | AUX_INT :  -13.65 | CsaBias :   32.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.56966e-03 / 2
  ADC_P0  : -1.36459e-02 ± 3.43079e-02
  ADC_P1  : 9.23998e-03 ± 8.86811e-04
  ADC_P2  : -7.73668e-06 ± 4.62273e-06
  CSA_Chi2/NDF : 1.14829e-04 / 2
  CSA_P0  : 5.81998e-02 ± 7.14740e-03
  CSA_P1  : 1.11846e-02 ± 5.38505e-04
  CSA_P2  : -8.50862e-05 ± 8.20080e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [0, 20, 22, 23, 29, 40, 41, 44, 46, 48, 60, 71, 91, 99, 108, 111, 114, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [8, 11, 13, 14, 18, 46, 51, 52, 78, 104, 108, 121, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3472', '1.800', '0.1076', '1.800', '0.1071', '7.000', '0.7091', 1, 1, 1, 1, 1724395923.0868032]
VI_after__Init : ['1.201', '0.3491', '1.800', '0.1083', '1.799', '0.0996', '7.000', '0.7080', 1, 1, 1, 1, 1724395930.95825]
VI_at__the_End : ['1.194', '0.4151', '1.800', '0.1329', '1.799', '0.1300', '7.000', '0.7086', 1, 1, 1, 1, 1724395996.6671383]