TEST_NAME : Wafer
TEST_DATE : 24_08_23-09_18_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-004-007-06 | FUSED_ID : 6359364768385482870
  IC_TEMP :  -83.23 | VDDM : 1124.38 | AUX_INT :  -11.48 | CsaBias :   67.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.45788e-03 / 2
  ADC_P0  : -1.14812e-02 ± 3.37645e-02
  ADC_P1  : 8.79069e-03 ± 8.73914e-04
  ADC_P2  : -5.57526e-06 ± 4.53556e-06
  CSA_Chi2/NDF : 1.62891e-04 / 2
  CSA_P0  : 5.77607e-02 ± 8.51276e-03
  CSA_P1  : 1.01582e-02 ± 6.41375e-04
  CSA_P2  : -6.29103e-05 ± 9.76738e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [2, 3, 6, 12, 61, 80, 81, 88, 121, 124, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [7, 8, 18, 33, 40, 46, 47, 55, 64, 70, 72, 82, 95, 98, 101, 121, 123, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2303', '1.800', '0.1396', '1.800', '0.0954', '7.000', '0.7079', 1, 1, 1, 1, 1724397536.7520332]
VI_after__Init : ['1.202', '0.2310', '1.800', '0.1398', '1.799', '0.0895', '7.000', '0.7079', 1, 1, 1, 1, 1724397545.0314348]
VI_at__the_End : ['1.201', '0.4438', '1.800', '0.1360', '1.808', '0.1266', '7.000', '0.7087', 1, 1, 1, 1, 1724397600.468439]