TEST_NAME : Wafer
TEST_DATE : 24_08_23-10_19_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-005-004-11 | FUSED_ID : 6359364768385486923
  IC_TEMP :  -74.58 | VDDM : 1116.05 | AUX_INT :  -10.50 | CsaBias :   68.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74206e-03 / 2
  ADC_P0  : -1.04986e-02 ± 2.82976e-02
  ADC_P1  : 8.87313e-03 ± 7.25312e-04
  ADC_P2  : -6.61739e-06 ± 3.71092e-06
  CSA_Chi2/NDF : 1.94347e-04 / 2
  CSA_P0  : 5.99601e-02 ± 9.29847e-03
  CSA_P1  : 1.06831e-02 ± 7.00573e-04
  CSA_P2  : -6.56845e-05 ± 1.06689e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [6, 12, 23, 44, 82, 85, 93, 100, 104, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [9, 13, 42, 59, 74, 75, 80, 91, 101, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1623', '1.800', '0.1543', '1.800', '0.0862', '7.000', '0.7083', 1, 1, 1, 1, 1724401169.5238457]
VI_after__Init : ['1.202', '0.1625', '1.800', '0.1544', '1.800', '0.0807', '7.000', '0.7080', 1, 1, 1, 1, 1724401178.2991755]
VI_at__the_End : ['1.201', '0.4648', '1.800', '0.1419', '1.800', '0.1226', '7.000', '0.7091', 1, 1, 1, 1, 1724401244.3108313]