TEST_NAME : Wafer
TEST_DATE : 24_08_23-10_16_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-005-006-11 | FUSED_ID : 6359364768385486955
  IC_TEMP :  -87.06 | VDDM : 1110.25 | AUX_INT :  -12.75 | CsaBias :   41.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.59537e-03 / 2
  ADC_P0  : -1.27526e-02 ± 3.45553e-02
  ADC_P1  : 9.12051e-03 ± 8.84307e-04
  ADC_P2  : -7.85042e-06 ± 4.51929e-06
  CSA_Chi2/NDF : 1.28995e-04 / 2
  CSA_P0  : 5.83136e-02 ± 7.57546e-03
  CSA_P1  : 1.00334e-02 ± 5.70756e-04
  CSA_P2  : -6.54554e-05 ± 8.69194e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [2, 5, 8, 13, 18, 20, 78, 95, 97, 100, 116, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  21
 | P_BROKEN_FAST :  [0, 4, 5, 6, 13, 31, 34, 37, 45, 49, 51, 66, 85, 95, 110, 117, 118, 119, 123, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2537', '1.800', '0.1700', '1.800', '0.0982', '7.000', '0.7081', 1, 1, 1, 1, 1724400977.6160154]
VI_after__Init : ['1.201', '0.2537', '1.800', '0.1705', '1.800', '0.0916', '7.000', '0.7080', 1, 1, 1, 1, 1724400986.3973572]
VI_at__the_End : ['1.201', '0.4267', '1.800', '0.1350', '1.800', '0.1219', '7.000', '0.7088', 1, 1, 1, 1, 1724401053.2680569]