TEST_NAME : Wafer
TEST_DATE : 24_08_23-09_47_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-005-024-12 | FUSED_ID : 6359364768385487244
  IC_TEMP :  -75.50 | VDDM : 1119.99 | AUX_INT :   -8.58 | CsaBias :   52.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16661e-03 / 2
  ADC_P0  : -8.58287e-03 ± 2.31132e-02
  ADC_P1  : 8.71479e-03 ± 5.86255e-04
  ADC_P2  : -6.42446e-06 ± 2.95342e-06
  CSA_Chi2/NDF : 1.61509e-04 / 2
  CSA_P0  : 5.81206e-02 ± 8.47658e-03
  CSA_P1  : 1.03019e-02 ± 6.38649e-04
  CSA_P2  : -6.28503e-05 ± 9.72588e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 22, 25, 32, 43, 64, 82, 105, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [8, 9, 10, 17, 20, 34, 52, 64, 70, 80, 87, 100, 102, 104, 105, 111, 123, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2389', '1.800', '0.1178', '1.800', '0.0931', '7.000', '0.7080', 1, 1, 1, 1, 1724399259.4783075]
VI_after__Init : ['1.201', '0.2390', '1.800', '0.1177', '1.800', '0.0874', '7.000', '0.7079', 1, 1, 1, 1, 1724399267.7216804]
VI_at__the_End : ['1.201', '0.4538', '1.800', '0.1314', '1.799', '0.1238', '7.000', '0.7086', 1, 1, 1, 1, 1724399327.7579873]