TEST_NAME : Wafer
TEST_DATE : 24_08_23-10_22_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-006-004-05 | FUSED_ID : 6359364768385491013
  IC_TEMP :  -72.02 | VDDM : 1108.49 | AUX_INT :  -10.07 | CsaBias :   67.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.87255e-03 / 2
  ADC_P0  : -1.00711e-02 ± 2.93858e-02
  ADC_P1  : 8.70431e-03 ± 7.45786e-04
  ADC_P2  : -6.16949e-06 ± 3.76922e-06
  CSA_Chi2/NDF : 2.14644e-04 / 2
  CSA_P0  : 5.93094e-02 ± 9.77197e-03
  CSA_P1  : 1.03871e-02 ± 7.36248e-04
  CSA_P2  : -6.08901e-05 ± 1.12122e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [5, 12, 30, 66, 71, 72, 85, 88, 91, 99, 102, 112, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [23, 25, 32, 36, 38, 72, 94, 102, 104, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2767', '1.800', '0.1624', '1.799', '0.0380', '7.000', '0.7059', 1, 1, 1, 1, 1724401355.962241]
VI_after__Init : ['1.201', '0.2767', '1.800', '0.1624', '1.800', '0.0905', '7.000', '0.7079', 1, 1, 1, 1, 1724401364.1524527]
VI_at__the_End : ['1.201', '0.4670', '1.800', '0.1384', '1.800', '0.1215', '7.000', '0.7085', 1, 1, 1, 1, 1724401423.855747]