TEST_NAME : Wafer
TEST_DATE : 24_08_23-10_25_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-006-006-05 | FUSED_ID : 6359364768385491045
  IC_TEMP :  -68.88 | VDDM : 1116.56 | AUX_INT :   -9.36 | CsaBias :   58.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53531e-03 / 2
  ADC_P0  : -9.35956e-03 ± 2.65780e-02
  ADC_P1  : 8.46735e-03 ± 6.58145e-04
  ADC_P2  : -5.80938e-06 ± 3.24269e-06
  CSA_Chi2/NDF : 1.51879e-04 / 2
  CSA_P0  : 5.81455e-02 ± 8.21999e-03
  CSA_P1  : 1.01088e-02 ± 6.19317e-04
  CSA_P2  : -5.68814e-05 ± 9.43146e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [13, 22, 23, 30, 34, 43, 45, 52, 59, 71, 73, 78, 94, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [11, 14, 26, 27, 30, 51, 64, 76, 77, 85, 89, 94, 98, 102, 109, 117, 120, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2108', '1.800', '0.1628', '1.799', '0.0969', '6.997', '0.7074', 1, 1, 1, 1, 1724401548.1378798]
VI_after__Init : ['1.202', '0.2108', '1.800', '0.1628', '1.800', '0.0911', '7.000', '0.7074', 1, 1, 1, 1, 1724401556.2193441]
VI_at__the_End : ['1.202', '0.4646', '1.800', '0.1372', '1.800', '0.1207', '7.000', '0.7082', 1, 1, 1, 1, 1724401623.2521172]