TEST_NAME : Wafer
TEST_DATE : 24_08_23-10_48_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-006-020-02 | FUSED_ID : 6359364768385491266
  IC_TEMP :  -64.41 | VDDM : 1126.32 | AUX_INT :   -9.49 | CsaBias :   53.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34534e-03 / 2
  ADC_P0  : -9.49481e-03 ± 2.47811e-02
  ADC_P1  : 8.99578e-03 ± 6.32850e-04
  ADC_P2  : -7.69593e-06 ± 3.20531e-06
  CSA_Chi2/NDF : 1.60707e-04 / 2
  CSA_P0  : 6.08490e-02 ± 8.45550e-03
  CSA_P1  : 1.02715e-02 ± 6.37061e-04
  CSA_P2  : -5.71321e-05 ± 9.70168e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [23, 28, 32, 37, 38, 52, 53, 55, 79, 82, 92, 115, 122, 124, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 9, 15, 31, 37, 38, 42, 49, 63, 67, 70, 73, 91, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3604', '1.800', '0.1501', '1.800', '0.0979', '7.000', '0.7073', 1, 1, 1, 1, 1724402889.1369503]
VI_after__Init : ['1.201', '0.3608', '1.800', '0.1502', '1.800', '0.0920', '7.000', '0.7075', 1, 1, 1, 1, 1724402897.330351]
VI_at__the_End : ['1.201', '0.4767', '1.800', '0.1379', '1.800', '0.1186', '7.000', '0.7085', 1, 1, 1, 1, 1724402963.968336]