TEST_NAME : Wafer
TEST_DATE : 24_08_23-11_04_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-007-023-15 | FUSED_ID : 6359364768385495423
  IC_TEMP :  -59.79 | VDDM : 1120.53 | AUX_INT :   -9.70 | CsaBias :   67.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45031e-03 / 2
  ADC_P0  : -9.69777e-03 ± 2.57820e-02
  ADC_P1  : 8.64543e-03 ± 6.42528e-04
  ADC_P2  : -6.50901e-06 ± 3.18556e-06
  CSA_Chi2/NDF : 1.81327e-04 / 2
  CSA_P0  : 5.74244e-02 ± 8.98160e-03
  CSA_P1  : 9.90975e-03 ± 6.76698e-04
  CSA_P2  : -5.02147e-05 ± 1.03053e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [21, 41, 44, 55, 59, 61, 70, 78, 88, 90, 92, 97, 100, 106, 108, 121, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [4, 9, 19, 48, 59, 69, 94, 101, 104, 108, 122, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2408', '1.800', '0.1675', '1.800', '0.0900', '6.998', '0.7084', 1, 1, 1, 1, 1724403845.656965]
VI_after__Init : ['1.202', '0.2408', '1.800', '0.1676', '1.799', '0.0826', '7.000', '0.7074', 1, 1, 1, 1, 1724403853.8164237]
VI_at__the_End : ['1.201', '0.4789', '1.800', '0.1384', '1.804', '0.1150', '7.000', '0.7079', 1, 1, 1, 1, 1724403921.7522354]