TEST_NAME : Wafer
TEST_DATE : 24_08_23-11_55_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-008-013-12 | FUSED_ID : 6359364768385499356
  IC_TEMP :  -58.77 | VDDM : 1125.26 | AUX_INT :  -10.00 | CsaBias :   65.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58120e-03 / 2
  ADC_P0  : -1.00037e-02 ± 2.69604e-02
  ADC_P1  : 8.49068e-03 ± 6.66130e-04
  ADC_P2  : -5.84878e-06 ± 3.28497e-06
  CSA_Chi2/NDF : 1.55983e-04 / 2
  CSA_P0  : 5.91393e-02 ± 8.33032e-03
  CSA_P1  : 9.92083e-03 ± 6.27629e-04
  CSA_P2  : -5.19143e-05 ± 9.55805e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [13, 27, 33, 34, 38, 42, 67, 74, 85, 87, 95, 97, 104, 112, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [4, 12, 13, 35, 36, 39, 41, 44, 49, 50, 58, 59, 62, 63, 78, 89, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2018', '1.800', '0.1418', '1.800', '0.0893', '7.000', '0.7079', 1, 1, 1, 1, 1724406908.3267527]
VI_after__Init : ['1.201', '0.2016', '1.800', '0.1418', '1.799', '0.0835', '7.000', '0.7077', 1, 1, 1, 1, 1724406916.5120542]
VI_at__the_End : ['1.201', '0.4732', '1.800', '0.1378', '1.800', '0.1154', '7.000', '0.7088', 1, 1, 1, 1, 1724406981.5576448]