TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_03_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-008-018-11 | FUSED_ID : 6359364768385499435
  IC_TEMP :  -55.67 | VDDM : 1122.21 | AUX_INT :   -9.11 | CsaBias :   66.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33944e-03 / 2
  ADC_P0  : -9.11245e-03 ± 2.47874e-02
  ADC_P1  : 8.43688e-03 ± 6.08364e-04
  ADC_P2  : -5.96505e-06 ± 2.96938e-06
  CSA_Chi2/NDF : 1.13350e-04 / 2
  CSA_P0  : 5.89008e-02 ± 7.10124e-03
  CSA_P1  : 9.71990e-03 ± 5.35027e-04
  CSA_P2  : -4.78179e-05 ± 8.14783e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [7, 13, 18, 25, 32, 35, 40, 49, 54, 55, 75, 91, 92, 99, 100, 105, 110, 114, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [5, 16, 43, 61, 66, 77, 85, 91, 95, 99, 106, 117, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2121', '1.800', '0.1238', '1.799', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1724407386.5914228]
VI_after__Init : ['1.201', '0.2123', '1.800', '0.1238', '1.800', '0.0797', '7.000', '0.7079', 1, 1, 1, 1, 1724407394.7388558]
VI_at__the_End : ['1.201', '0.4778', '1.800', '0.1382', '1.801', '0.1152', '7.000', '0.7085', 1, 1, 1, 1, 1724407462.236429]