TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_07_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-008-021-11 | FUSED_ID : 6359364768385499483
  IC_TEMP :  -61.20 | VDDM : 1126.77 | AUX_INT :   -8.62 | CsaBias :   69.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06600e-03 / 2
  ADC_P0  : -8.62023e-03 ± 2.20346e-02
  ADC_P1  : 8.72970e-03 ± 5.48941e-04
  ADC_P2  : -7.14963e-06 ± 2.71035e-06
  CSA_Chi2/NDF : 2.39143e-04 / 2
  CSA_P0  : 6.00127e-02 ± 1.03146e-02
  CSA_P1  : 1.03713e-02 ± 7.77128e-04
  CSA_P2  : -5.64015e-05 ± 1.18347e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [5, 9, 20, 23, 32, 43, 46, 47, 52, 55, 58, 62, 97, 102, 104, 113, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [27, 28, 32, 34, 43, 53, 65, 80, 105, 107, 126, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2495', '1.800', '0.1472', '1.800', '0.0882', '7.000', '0.7085', 1, 1, 1, 1, 1724407672.5346916]
VI_after__Init : ['1.201', '0.2495', '1.800', '0.1470', '1.801', '0.0808', '7.000', '0.7078', 1, 1, 1, 1, 1724407681.3000004]
VI_at__the_End : ['1.201', '0.4889', '1.800', '0.1375', '1.804', '0.1154', '7.000', '0.7086', 1, 1, 1, 1, 1724407741.017271]