TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_12_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-008-024-11 | FUSED_ID : 6359364768385499531
  IC_TEMP :  -50.90 | VDDM : 1128.91 | AUX_INT :   -8.09 | CsaBias :   80.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19756e-03 / 2
  ADC_P0  : -8.08794e-03 ± 2.34495e-02
  ADC_P1  : 8.06996e-03 ± 5.56813e-04
  ADC_P2  : -5.27363e-06 ± 2.62158e-06
  CSA_Chi2/NDF : 1.08798e-04 / 2
  CSA_P0  : 5.84047e-02 ± 6.95718e-03
  CSA_P1  : 9.42531e-03 ± 5.24173e-04
  CSA_P2  : -4.04936e-05 ± 7.98254e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [14, 31, 36, 43, 63, 74, 76, 93, 113, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [0, 16, 38, 53, 64, 68, 70, 75, 80, 81, 126, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1604', '1.800', '0.1653', '1.799', '0.0881', '7.000', '0.7076', 1, 1, 1, 1, 1724407960.586032]
VI_after__Init : ['1.201', '0.1604', '1.800', '0.1652', '1.799', '0.0824', '7.000', '0.7078', 1, 1, 1, 1, 1724407968.7293344]
VI_at__the_End : ['1.201', '0.4878', '1.800', '0.1331', '1.802', '0.1108', '7.000', '0.7086', 1, 1, 1, 1, 1724408028.3808112]