TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_17_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-008-027-11 | FUSED_ID : 6359364768385499579
  IC_TEMP :  -59.26 | VDDM : 1123.04 | AUX_INT :   -8.44 | CsaBias :   63.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42727e-03 / 2
  ADC_P0  : -8.43736e-03 ± 2.56167e-02
  ADC_P1  : 9.10055e-03 ± 6.82801e-04
  ADC_P2  : -6.90962e-06 ± 3.60419e-06
  CSA_Chi2/NDF : 1.93248e-04 / 2
  CSA_P0  : 6.00037e-02 ± 9.27215e-03
  CSA_P1  : 1.02846e-02 ± 6.98589e-04
  CSA_P2  : -5.43326e-05 ± 1.06387e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [15, 17, 23, 31, 69, 73, 78, 81, 84, 91, 93, 104, 113, 114, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 6, 13, 22, 31, 32, 40, 46, 67, 74, 96, 119, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1726', '1.800', '0.1407', '1.800', '0.0880', '7.000', '0.7075', 1, 1, 1, 1, 1724408246.9868233]
VI_after__Init : ['1.201', '0.1726', '1.800', '0.1405', '1.799', '0.0826', '7.000', '0.7076', 1, 1, 1, 1, 1724408255.7900429]
VI_at__the_End : ['1.201', '0.4874', '1.800', '0.1370', '1.799', '0.1142', '7.000', '0.7083', 1, 1, 1, 1, 1724408322.306938]