TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_27_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-009-022-06 | FUSED_ID : 6359364768385503590
  IC_TEMP :  -75.02 | VDDM : 1193.14 | AUX_INT : -767.19 | CsaBias : -567.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.67934e-02 / 2
  ADC_P0  : -7.67193e-01 ± 2.35677e-01
  ADC_P1  : 2.04641e-02 ± 4.74375e-03
  ADC_P2  : -4.87746e-05 ± 1.94681e-05
  CSA_Chi2/NDF : 1.71287e-04 / 2
  CSA_P0  : 5.88653e-02 ± 8.72940e-03
  CSA_P1  : 1.03553e-02 ± 6.57697e-04
  CSA_P2  : -5.44308e-05 ± 1.00159e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 7, 18, 24, 44, 54, 55, 56, 59, 71, 91, 92, 93, 98, 107, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [0, 2, 44, 53, 55, 72, 82, 85, 89, 97, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2888', '1.800', '0.1469', '1.800', '0.0897', '7.000', '0.7076', 1, 1, 1, 1, 1724408822.0155933]
VI_after__Init : ['1.201', '0.2888', '1.800', '0.1468', '1.800', '0.0839', '7.000', '0.7076', 1, 1, 1, 1, 1724408830.9289453]
VI_at__the_End : ['1.201', '0.4885', '1.800', '0.1366', '1.799', '0.1142', '7.001', '0.7087', 1, 1, 1, 1, 1724408886.887611]