TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_25_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-009-023-06 | FUSED_ID : 6359364768385503606
  IC_TEMP :  -62.82 | VDDM : 1122.21 | AUX_INT :   -9.11 | CsaBias :   58.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33944e-03 / 2
  ADC_P0  : -9.11245e-03 ± 2.47874e-02
  ADC_P1  : 8.43688e-03 ± 6.08364e-04
  ADC_P2  : -5.96505e-06 ± 2.96938e-06
  CSA_Chi2/NDF : 1.89526e-04 / 2
  CSA_P0  : 5.94498e-02 ± 9.18242e-03
  CSA_P1  : 1.04177e-02 ± 6.91829e-04
  CSA_P2  : -5.73491e-05 ± 1.05357e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [14, 51, 53, 56, 57, 58, 62, 63, 65, 94, 99, 104, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 5, 8, 17, 20, 33, 37, 49, 56, 59, 68, 79, 82, 91, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1867', '1.800', '0.1503', '1.799', '0.0850', '7.000', '0.7077', 1, 1, 1, 1, 1724408725.8968976]
VI_after__Init : ['1.201', '0.1868', '1.800', '0.1503', '1.800', '0.0796', '7.000', '0.7074', 1, 1, 1, 1, 1724408733.9323661]
VI_at__the_End : ['1.200', '0.4833', '1.800', '0.1370', '1.800', '0.1160', '7.000', '0.7084', 1, 1, 1, 1, 1724408802.5061338]