TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_23_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-009-024-06 | FUSED_ID : 6359364768385503622
  IC_TEMP :  -57.36 | VDDM : 1120.74 | AUX_INT :   -8.45 | CsaBias :   79.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36165e-03 / 2
  ADC_P0  : -8.45447e-03 ± 2.50483e-02
  ADC_P1  : 8.08320e-03 ± 6.01804e-04
  ADC_P2  : -4.87502e-06 ± 2.87482e-06
  CSA_Chi2/NDF : 1.43216e-04 / 2
  CSA_P0  : 5.88338e-02 ± 7.98211e-03
  CSA_P1  : 9.65961e-03 ± 6.01395e-04
  CSA_P2  : -4.49684e-05 ± 9.15853e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [8, 14, 19, 40, 44, 63, 78, 100, 101, 116, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [4, 19, 20, 30, 33, 50, 62, 71, 77, 95, 97, 99, 108, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3843', '1.800', '0.1415', '1.799', '0.0982', '7.000', '0.7076', 1, 1, 1, 1, 1724408630.2201967]
VI_after__Init : ['1.201', '0.3844', '1.800', '0.1416', '1.799', '0.0923', '7.000', '0.7076', 1, 1, 1, 1, 1724408638.2896502]
VI_at__the_End : ['1.201', '0.4846', '1.800', '0.1362', '1.805', '0.1149', '7.000', '0.7083', 1, 1, 1, 1, 1724408697.9830148]