TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_20_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-009-026-06 | FUSED_ID : 6359364768385503654
  IC_TEMP :  -61.91 | VDDM : 1110.83 | AUX_INT :  -10.84 | CsaBias :   75.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.94762e-03 / 2
  ADC_P0  : -1.08352e-02 ± 2.99555e-02
  ADC_P1  : 8.74195e-03 ± 7.58522e-04
  ADC_P2  : -6.28054e-06 ± 3.83714e-06
  CSA_Chi2/NDF : 1.95346e-04 / 2
  CSA_P0  : 6.10413e-02 ± 9.32234e-03
  CSA_P1  : 1.01650e-02 ± 7.02371e-04
  CSA_P2  : -5.42214e-05 ± 1.06963e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [53, 65, 73, 75, 81, 85, 97, 104, 106, 110, 111, 112, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 4, 12, 23, 24, 37, 38, 45, 53, 56, 61, 72, 78, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4009', '1.800', '0.1588', '1.799', '0.0964', '7.000', '0.7075', 1, 1, 1, 1, 1724408438.0030093]
VI_after__Init : ['1.201', '0.4016', '1.800', '0.1589', '1.801', '0.0908', '7.000', '0.7073', 1, 1, 1, 1, 1724408446.7543337]
VI_at__the_End : ['1.201', '0.4784', '1.800', '0.1383', '1.800', '0.1178', '7.000', '0.7085', 1, 1, 1, 1, 1724408507.0677316]