TEST_NAME : Wafer
TEST_DATE : 24_08_23-12_19_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-009-027-06 | FUSED_ID : 6359364768385503670
  IC_TEMP :  -60.86 | VDDM : 1120.74 | AUX_INT :   -8.45 | CsaBias :   63.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36165e-03 / 2
  ADC_P0  : -8.45447e-03 ± 2.50483e-02
  ADC_P1  : 8.08320e-03 ± 6.01804e-04
  ADC_P2  : -4.87502e-06 ± 2.87482e-06
  CSA_Chi2/NDF : 1.88991e-04 / 2
  CSA_P0  : 5.58165e-02 ± 9.16944e-03
  CSA_P1  : 1.01398e-02 ± 6.90851e-04
  CSA_P2  : -5.34632e-05 ± 1.05208e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [16, 23, 38, 42, 45, 46, 75, 78, 81, 87, 88, 89, 98, 108, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 7, 11, 25, 29, 30, 42, 46, 48, 57, 65, 88, 110, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2774', '1.800', '0.1320', '1.800', '0.0936', '7.000', '0.7077', 1, 1, 1, 1, 1724408342.7403624]
VI_after__Init : ['1.201', '0.2774', '1.800', '0.1321', '1.800', '0.0882', '7.001', '0.7075', 1, 1, 1, 1, 1724408350.883745]
VI_at__the_End : ['1.201', '0.4755', '1.800', '0.1335', '1.800', '0.1156', '7.000', '0.7086', 1, 1, 1, 1, 1724408417.9455674]