TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_27_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-010-019-08 | FUSED_ID : 6359364768385507640
  IC_TEMP :  -65.83 | VDDM : 1099.28 | AUX_INT :   -9.48 | CsaBias :   57.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49304e-03 / 2
  ADC_P0  : -9.48003e-03 ± 2.62176e-02
  ADC_P1  : 8.44705e-03 ± 6.51355e-04
  ADC_P2  : -5.52033e-06 ± 3.22753e-06
  CSA_Chi2/NDF : 1.77619e-04 / 2
  CSA_P0  : 5.80236e-02 ± 8.88930e-03
  CSA_P1  : 1.02828e-02 ± 6.69744e-04
  CSA_P2  : -6.05037e-05 ± 1.01994e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [4, 9, 11, 39, 40, 44, 45, 50, 52, 73, 76, 82, 99, 108, 116, 118, 122, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 15, 22, 27, 41, 43, 52, 56, 70, 71, 97, 99, 107, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2418', '1.800', '0.1318', '1.800', '0.0937', '7.001', '0.7079', 1, 1, 1, 1, 1724412460.1683671]
VI_after__Init : ['1.201', '0.2419', '1.800', '0.1318', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1724412468.2096982]
VI_at__the_End : ['1.201', '0.4610', '1.800', '0.1372', '1.805', '0.1164', '7.000', '0.7086', 1, 1, 1, 1, 1724412536.034014]