TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_30_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-010-021-08 | FUSED_ID : 6359364768385507672
  IC_TEMP :  -69.70 | VDDM : 1123.13 | AUX_INT :   -9.42 | CsaBias :   67.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43882e-03 / 2
  ADC_P0  : -9.42035e-03 ± 2.56715e-02
  ADC_P1  : 8.65226e-03 ± 6.37721e-04
  ADC_P2  : -6.75588e-06 ± 3.14389e-06
  CSA_Chi2/NDF : 1.58189e-04 / 2
  CSA_P0  : 5.85352e-02 ± 8.38902e-03
  CSA_P1  : 1.01193e-02 ± 6.32052e-04
  CSA_P2  : -5.81288e-05 ± 9.62540e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [1, 18, 30, 35, 37, 45, 65, 69, 75, 91, 111, 117, 118, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 10, 13, 15, 31, 39, 40, 45, 48, 51, 86, 93, 96, 106, 116, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2439', '1.800', '0.1599', '1.800', '0.0915', '7.001', '0.7079', 1, 1, 1, 1, 1724412651.6320286]
VI_after__Init : ['1.201', '0.2435', '1.800', '0.1599', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1724412660.42215]
VI_at__the_End : ['1.201', '0.4609', '1.800', '0.1349', '1.805', '0.1191', '7.001', '0.7090', 1, 1, 1, 1, 1724412719.207221]