TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_40_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-010-027-08 | FUSED_ID : 6359364768385507768
  IC_TEMP :  -58.84 | VDDM : 1126.92 | AUX_INT :   -9.59 | CsaBias :   66.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53347e-03 / 2
  ADC_P0  : -9.58584e-03 ± 2.65703e-02
  ADC_P1  : 8.46007e-03 ± 6.60115e-04
  ADC_P2  : -5.58756e-06 ± 3.27094e-06
  CSA_Chi2/NDF : 1.84027e-04 / 2
  CSA_P0  : 5.58647e-02 ± 9.04822e-03
  CSA_P1  : 1.02802e-02 ± 6.81718e-04
  CSA_P2  : -5.42528e-05 ± 1.03818e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [20, 45, 49, 55, 70, 75, 76, 91, 98, 99, 112, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [7, 14, 15, 17, 29, 41, 69, 72, 73, 95, 104, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2305', '1.800', '0.1108', '1.800', '0.0830', '7.000', '0.7079', 1, 1, 1, 1, 1724413227.0505698]
VI_after__Init : ['1.201', '0.2306', '1.800', '0.1108', '1.801', '0.0774', '6.998', '0.7078', 1, 1, 1, 1, 1724413235.8488064]
VI_at__the_End : ['1.202', '0.4844', '1.800', '0.1334', '1.804', '0.1138', '7.000', '0.7088', 1, 1, 1, 1, 1724413302.6064024]