TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_58_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-011-017-05 | FUSED_ID : 6359364768385511701
  IC_TEMP :  -65.40 | VDDM : 1125.08 | AUX_INT :   -8.28 | CsaBias :   52.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00545e-03 / 2
  ADC_P0  : -8.27958e-03 ± 2.14237e-02
  ADC_P1  : 8.67594e-03 ± 5.38458e-04
  ADC_P2  : -6.57158e-06 ± 2.68667e-06
  CSA_Chi2/NDF : 1.52009e-04 / 2
  CSA_P0  : 5.85728e-02 ± 8.22352e-03
  CSA_P1  : 1.05415e-02 ± 6.19583e-04
  CSA_P2  : -6.33464e-05 ± 9.43551e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [7, 23, 40, 67, 70, 99, 111, 119, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 5, 15, 30, 36, 49, 75, 77, 82, 87, 92, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4548', '1.800', '0.1811', '1.799', '0.0961', '6.998', '0.7075', 1, 1, 1, 1, 1724414281.7373002]
VI_after__Init : ['1.201', '0.4556', '1.800', '0.1813', '1.801', '0.0902', '7.001', '0.7074', 1, 1, 1, 1, 1724414289.7617242]
VI_at__the_End : ['1.201', '0.4679', '1.800', '0.1375', '1.801', '0.1158', '7.000', '0.7079', 1, 1, 1, 1, 1724414350.0679846]