TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_56_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-011-018-05 | FUSED_ID : 6359364768385511717
  IC_TEMP :  -61.88 | VDDM : 1120.65 | AUX_INT :   -9.82 | CsaBias :   67.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60637e-03 / 2
  ADC_P0  : -9.81841e-03 ± 2.71755e-02
  ADC_P1  : 8.66675e-03 ± 6.83424e-04
  ADC_P2  : -6.32772e-06 ± 3.42088e-06
  CSA_Chi2/NDF : 1.23651e-04 / 2
  CSA_P0  : 5.67126e-02 ± 7.41688e-03
  CSA_P1  : 9.65704e-03 ± 5.58808e-04
  CSA_P2  : -4.89252e-05 ± 8.50999e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [12, 37, 54, 68, 71, 92, 99, 104, 112, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [10, 14, 15, 20, 25, 43, 44, 70, 71, 76, 85, 100, 102, 107, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3512', '1.800', '0.1509', '1.799', '0.0954', '7.000', '0.7072', 1, 1, 1, 1, 1724414185.949843]
VI_after__Init : ['1.201', '0.3512', '1.800', '0.1510', '1.800', '0.0896', '7.000', '0.7074', 1, 1, 1, 1, 1724414194.092174]
VI_at__the_End : ['1.201', '0.4670', '1.800', '0.1360', '1.801', '0.1153', '7.000', '0.7080', 1, 1, 1, 1, 1724414252.4225187]