TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_54_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-011-019-05 | FUSED_ID : 6359364768385511733
  IC_TEMP :  -70.36 | VDDM : 1121.41 | AUX_INT :   -9.07 | CsaBias :   59.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35724e-03 / 2
  ADC_P0  : -9.07168e-03 ± 2.49603e-02
  ADC_P1  : 8.59711e-03 ± 6.25506e-04
  ADC_P2  : -6.16830e-06 ± 3.11613e-06
  CSA_Chi2/NDF : 1.71169e-04 / 2
  CSA_P0  : 6.08689e-02 ± 8.72640e-03
  CSA_P1  : 1.03843e-02 ± 6.57471e-04
  CSA_P2  : -6.06583e-05 ± 1.00125e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [6, 13, 40, 42, 47, 51, 54, 65, 70, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 4, 6, 17, 29, 31, 49, 104, 109, 112, 114, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4266', '1.800', '0.1638', '1.800', '0.1006', '7.000', '0.7072', 1, 1, 1, 1, 1724414089.971379]
VI_after__Init : ['1.201', '0.4264', '1.800', '0.1639', '1.799', '0.0947', '7.001', '0.7072', 1, 1, 1, 1, 1724414098.0537252]
VI_at__the_End : ['1.201', '0.4674', '1.800', '0.1376', '1.799', '0.1153', '7.000', '0.7080', 1, 1, 1, 1, 1724414165.7753541]