TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_53_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-011-020-05 | FUSED_ID : 6359364768385511749
  IC_TEMP :  -63.62 | VDDM : 1111.19 | AUX_INT :   -9.11 | CsaBias :   50.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31708e-03 / 2
  ADC_P0  : -9.11197e-03 ± 2.45960e-02
  ADC_P1  : 8.56956e-03 ± 6.18425e-04
  ADC_P2  : -5.81590e-06 ± 3.09859e-06
  CSA_Chi2/NDF : 1.58368e-04 / 2
  CSA_P0  : 5.99658e-02 ± 8.39374e-03
  CSA_P1  : 1.03948e-02 ± 6.32408e-04
  CSA_P2  : -5.91030e-05 ± 9.63083e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [2, 24, 25, 36, 46, 50, 67, 72, 77, 83, 99, 104, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [11, 31, 33, 65, 66, 75, 83, 90, 93, 102, 104, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0926', '1.800', '0.1536', '1.799', '0.0794', '7.000', '0.7071', 1, 1, 1, 1, 1724413994.116842]
VI_after__Init : ['1.201', '0.0927', '1.800', '0.1535', '1.800', '0.0737', '6.998', '0.7072', 1, 1, 1, 1, 1724414002.918045]
VI_at__the_End : ['1.201', '0.4758', '1.800', '0.1390', '1.804', '0.1153', '7.000', '0.7078', 1, 1, 1, 1, 1724414069.2868934]