TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_50_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-011-022-05 | FUSED_ID : 6359364768385511781
  IC_TEMP :  -66.93 | VDDM : 1124.15 | AUX_INT :   -7.73 | CsaBias :   52.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07186e-03 / 2
  ADC_P0  : -7.72648e-03 ± 2.21650e-02
  ADC_P1  : 8.66456e-03 ± 5.63486e-04
  ADC_P2  : -6.24659e-06 ± 2.83607e-06
  CSA_Chi2/NDF : 1.65785e-04 / 2
  CSA_P0  : 5.94660e-02 ± 8.58807e-03
  CSA_P1  : 1.01275e-02 ± 6.47049e-04
  CSA_P2  : -5.63743e-05 ± 9.85379e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [9, 10, 12, 16, 43, 48, 54, 64, 68, 74, 91, 94, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 1, 9, 11, 28, 45, 47, 64, 81, 83, 85, 92, 98, 108, 112, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3110', '1.800', '0.1436', '1.800', '0.0874', '7.001', '0.7072', 1, 1, 1, 1, 1724413803.1626747]
VI_after__Init : ['1.201', '0.3110', '1.800', '0.1436', '1.801', '0.0817', '7.001', '0.7073', 1, 1, 1, 1, 1724413811.26718]
VI_at__the_End : ['1.201', '0.4675', '1.800', '0.1360', '1.804', '0.1148', '7.000', '0.7078', 1, 1, 1, 1, 1724413877.1100004]