TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_43_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-011-026-05 | FUSED_ID : 6359364768385511845
  IC_TEMP :  -57.20 | VDDM : 1117.06 | AUX_INT :  -20.59 | CsaBias :   67.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.32368e-03 / 2
  ADC_P0  : -2.05921e-02 ± 3.33617e-02
  ADC_P1  : 8.84736e-03 ± 8.40299e-04
  ADC_P2  : -6.57621e-06 ± 4.23003e-06
  CSA_Chi2/NDF : 1.74394e-04 / 2
  CSA_P0  : 5.96187e-02 ± 8.80821e-03
  CSA_P1  : 1.02113e-02 ± 6.63635e-04
  CSA_P2  : -5.10910e-05 ± 1.01064e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 4, 26, 27, 75, 93, 97, 116, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 20, 26, 30, 75, 89, 116, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2787', '1.800', '0.1248', '1.800', '0.0882', '7.000', '0.7080', 1, 1, 1, 1, 1724413419.5381973]
VI_after__Init : ['1.201', '0.2788', '1.800', '0.1248', '1.801', '0.0824', '7.000', '0.7080', 1, 1, 1, 1, 1724413428.2634327]
VI_at__the_End : ['1.201', '0.4961', '1.800', '0.1385', '1.803', '0.1133', '6.994', '0.7086', 1, 1, 1, 1, 1724413488.757607]