TEST_NAME : Wafer
TEST_DATE : 24_08_23-13_42_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-011-027-05 | FUSED_ID : 6359364768385511861
  IC_TEMP :  -61.71 | VDDM : 1120.69 | AUX_INT :  -10.45 | CsaBias :   71.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.03116e-03 / 2
  ADC_P0  : -1.04493e-02 ± 3.06059e-02
  ADC_P1  : 8.28697e-03 ± 7.34136e-04
  ADC_P2  : -5.84268e-06 ± 3.50366e-06
  CSA_Chi2/NDF : 1.39830e-04 / 2
  CSA_P0  : 5.83078e-02 ± 7.88718e-03
  CSA_P1  : 9.64510e-03 ± 5.94242e-04
  CSA_P2  : -4.66319e-05 ± 9.04961e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [8, 26, 31, 88, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [13, 22, 27, 47, 48, 62, 80, 92, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2519', '1.800', '0.1339', '1.800', '0.0902', '7.001', '0.7092', 1, 1, 1, 1, 1724413323.3857937]
VI_after__Init : ['1.201', '0.2518', '1.800', '0.1340', '1.800', '0.0828', '7.000', '0.7083', 1, 1, 1, 1, 1724413331.4151204]
VI_at__the_End : ['1.201', '0.4768', '1.800', '0.1327', '1.800', '0.1143', '7.001', '0.7086', 1, 1, 1, 1, 1724413398.695777]