TEST_NAME : Wafer
TEST_DATE : 24_08_23-14_45_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-012-016-13 | FUSED_ID : 6359364768385515789
  IC_TEMP :  -60.14 | VDDM : 1119.63 | AUX_INT :   -9.37 | CsaBias :   82.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35801e-03 / 2
  ADC_P0  : -9.37141e-03 ± 2.49665e-02
  ADC_P1  : 8.42875e-03 ± 6.14750e-04
  ADC_P2  : -5.71525e-06 ± 3.01745e-06
  CSA_Chi2/NDF : 1.62014e-04 / 2
  CSA_P0  : 6.11023e-02 ± 8.48983e-03
  CSA_P1  : 1.02363e-02 ± 6.39647e-04
  CSA_P2  : -5.45711e-05 ± 9.74107e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [3, 4, 18, 34, 46, 48, 55, 76, 87, 112, 118, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 46, 54, 89, 98, 102, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2530', '1.800', '0.1601', '1.800', '0.0874', '7.000', '0.7078', 1, 1, 1, 1, 1724417150.8221745]
VI_after__Init : ['1.202', '0.2528', '1.800', '0.1600', '1.800', '0.0821', '7.000', '0.7079', 1, 1, 1, 1, 1724417159.0364208]
VI_at__the_End : ['1.202', '0.4849', '1.800', '0.1378', '1.799', '0.1141', '7.000', '0.7085', 1, 1, 1, 1, 1724417226.0871484]