TEST_NAME : Wafer
TEST_DATE : 24_08_23-14_50_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-012-019-13 | FUSED_ID : 6359364768385515837
  IC_TEMP :  -63.45 | VDDM : 1116.88 | AUX_INT :   -8.56 | CsaBias :   59.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17210e-03 / 2
  ADC_P0  : -8.56085e-03 ± 2.31523e-02
  ADC_P1  : 8.57016e-03 ± 5.73134e-04
  ADC_P2  : -6.52599e-06 ± 2.81232e-06
  CSA_Chi2/NDF : 1.56742e-04 / 2
  CSA_P0  : 5.99911e-02 ± 8.35055e-03
  CSA_P1  : 1.04912e-02 ± 6.29154e-04
  CSA_P2  : -5.95872e-05 ± 9.58126e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [25, 51, 65, 68, 70, 90, 104, 123, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 7, 8, 14, 23, 41, 53, 54, 73, 77, 100, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2177', '1.800', '0.1439', '1.800', '0.0854', '7.000', '0.7083', 1, 1, 1, 1, 1724417437.013237]
VI_after__Init : ['1.202', '0.2175', '1.800', '0.1437', '1.800', '0.0779', '7.000', '0.7074', 1, 1, 1, 1, 1724417445.7485607]
VI_at__the_End : ['1.202', '0.4800', '1.800', '0.1387', '1.800', '0.1172', '7.000', '0.7083', 1, 1, 1, 1, 1724417512.5902712]