TEST_NAME : Wafer
TEST_DATE : 24_08_23-14_52_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-012-020-13 | FUSED_ID : 6359364768385515853
  IC_TEMP :  -56.46 | VDDM : 1128.56 | AUX_INT :   -7.08 | CsaBias :   85.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.97875e-04 / 2
  ADC_P0  : -7.07926e-03 ± 2.02573e-02
  ADC_P1  : 8.45964e-03 ± 5.00858e-04
  ADC_P2  : -6.21749e-06 ± 2.44406e-06
  CSA_Chi2/NDF : 1.33807e-04 / 2
  CSA_P0  : 6.04118e-02 ± 7.71547e-03
  CSA_P1  : 9.70172e-03 ± 5.81305e-04
  CSA_P2  : -4.36028e-05 ± 8.85259e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [12, 17, 20, 31, 39, 50, 56, 70, 73, 78, 86, 103, 118, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [7, 9, 14, 19, 21, 30, 31, 33, 34, 38, 41, 50, 51, 52, 81, 86, 92, 99, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2520', '1.799', '0.1478', '1.799', '0.0877', '7.000', '0.7076', 1, 1, 1, 1, 1724417533.5105982]
VI_after__Init : ['1.202', '0.2523', '1.800', '0.1476', '1.799', '0.0818', '7.000', '0.7073', 1, 1, 1, 1, 1724417541.784005]
VI_at__the_End : ['1.202', '0.4975', '1.800', '0.1398', '1.800', '0.1114', '7.000', '0.7081', 1, 1, 1, 1, 1724417606.874875]